Scanning electron microscope

Results: 580



#Item
21Precambrian Research–54  Focussed ion beam preparation and in situ nanoscopic study of Precambrian acritarchs Andr´e Kempe a,1 , Richard Wirth b , Wladyslaw Altermann c,∗ , Robert W. Stark a , J. Willi

Precambrian Research–54 Focussed ion beam preparation and in situ nanoscopic study of Precambrian acritarchs Andr´e Kempe a,1 , Richard Wirth b , Wladyslaw Altermann c,∗ , Robert W. Stark a , J. Willi

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Source URL: www.nano-science.de

Language: English - Date: 2006-01-11 10:38:50
22ENHANCE – MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop WS-7. Nanostructuring methods utilising electron & ion beam pro

ENHANCE – MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop WS-7. Nanostructuring methods utilising electron & ion beam pro

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Source URL: www.enhance-itn.eu

Language: English - Date: 2012-08-26 06:50:01
23Palaeontologia Electronica http://palaeo-electronica.org Error rates and observer bias in dental microwear analysis using light microscopy Matthew C. Mihlbachler, Brian L. Beatty, Angela Caldera-Siu,

Palaeontologia Electronica http://palaeo-electronica.org Error rates and observer bias in dental microwear analysis using light microscopy Matthew C. Mihlbachler, Brian L. Beatty, Angela Caldera-Siu,

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Source URL: palaeo-electronica.org

Language: English - Date: 2014-11-23 16:51:20
24Stephanie Barnes Queen’s University, Kingston, ON An Investigation of Extreme Delamination in Nu Fémininby Montréal Artist Jori Smith

Stephanie Barnes Queen’s University, Kingston, ON An Investigation of Extreme Delamination in Nu Fémininby Montréal Artist Jori Smith

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Source URL: cool.conservation-us.org

Language: English - Date: 2015-03-27 14:48:02
25SURFACE AND INTERFACE ANALYSIS Surf. Interface Anal. 2005; 37: 895–900 Published online in Wiley InterScience (www.interscience.wiley.com). DOI: sia.2107 A new examination of secondary electron yield data Yingh

SURFACE AND INTERFACE ANALYSIS Surf. Interface Anal. 2005; 37: 895–900 Published online in Wiley InterScience (www.interscience.wiley.com). DOI: sia.2107 A new examination of secondary electron yield data Yingh

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Source URL: psec.uchicago.edu

Language: English - Date: 2009-06-24 12:40:33
26COUNTING AND IMAGING BACTERIA ON MINERAL SURFACES PHILIP C. BENNETT, ANNETTE SUMMERS ENGEL, AND JENNIFER A. ROBERTS INTRODUCTION  38

COUNTING AND IMAGING BACTERIA ON MINERAL SURFACES PHILIP C. BENNETT, ANNETTE SUMMERS ENGEL, AND JENNIFER A. ROBERTS INTRODUCTION 38

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Source URL: www.people.ku.edu

Language: English - Date: 2006-11-17 12:24:34
27Microscopes / Electron microscopy / Microscopy / Electron beam / Electron microscope / Pathology / Inverted microscope / Transmission electron microscopy / Scanning electron microscope / Biomaterials / Raman spectroscopy

Equipment for biomaterials processing and evaluation housed in the CBTRR (in B42 McNutt Hall): Spex SamplePrep Model 8500 shatttebox Microtrac S3000 particle size analyzer PMI liquid extrusion porosimeter Genesis 25 free

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Source URL: cbse.mst.edu

Language: English - Date: 2014-01-22 05:23:55
28Master 2 research project Title: « Chemical alteration and mineralogical composition of fault zones in shale rocks » Goals: The hydrogeological and mechanical properties of faults affecting consolidated clay-rocks are

Master 2 research project Title: « Chemical alteration and mineralogical composition of fault zones in shale rocks » Goals: The hydrogeological and mechanical properties of faults affecting consolidated clay-rocks are

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Source URL: www.master-imacs.org

Language: English - Date: 2015-11-25 03:44:31
29NANOSCOPY  APPLICATION NOTE M02 Scanning Probe Microscopes for extreme Environments

NANOSCOPY APPLICATION NOTE M02 Scanning Probe Microscopes for extreme Environments

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Source URL: www.rockgateco.com

Language: English - Date: 2014-02-03 00:20:24
30Electron microscopy / Scientific method / Learning / Chemistry / Focused ion beam / Microscope / Scanning electron microscope / Transmission electron microscopy / Electron microscope / Microscopy / Atomic-force microscopy

EXTERNAL CHARGES FOR EQUIPMENT IN THE GRADUATE CENTER FOR MATERIALS RESEARCH

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Source URL: amcl.mst.edu

Language: English - Date: 2016-02-25 17:45:59